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131	JTAG Boundary-Scan Testing in Arria 10 Devices Add to Reading List Source URL: www.altera.com Language: English - Date: 2014-08-15 04:44:26 Electronic engineering Embedded systems IEEE standards Joint Test Action Group Boundary scan Electronics manufacturing Manufacturing Electronics
132	AN 39: IEEE[removed]JTAG Boundary-Scan Testing in Altera Devices Add to Reading List Source URL: www.altera.com Language: English - Date: 2010-05-05 19:29:24 Electronic engineering Joint Test Action Group Boundary scan Altera Field-programmable gate array Shift register Boundary scan description language Serial Vector Format Electronics manufacturing Manufacturing Electronics
133	August 25, 1998 USE OF SX SERIES DEVICES AND IEEE[removed]JTAG CIRCUITRY Add to Reading List Source URL: klabs.org Language: English - Date: 2009-01-17 09:42:46 Electronic engineering Embedded systems IEEE standards Joint Test Action Group Boundary scan Serial Vector Format Electronics manufacturing Manufacturing Electronics
134	ITC Special Section Improving Transition Delay Test Using a Hybrid Method Nisar Ahmed and Mohammad Tehranipoor University of Connecticut Add to Reading List Source URL: www.engr.uconn.edu Language: English - Date: 2006-10-11 11:31:47 Electronic design automation Scan chain Automatic test pattern generation Electronic design Iddq testing Fault coverage Electronics manufacturing Design for testing Boundary scan Electronic engineering Electronics Integrated circuits
135	MAX V Device Handbook MAX V Device Handbook 101 Innovation Drive San Jose, CA 95134 Add to Reading List Source URL: www.altera.com Language: English - Date: 2011-05-04 02:57:47 Manufacturing Joint Test Action Group Field-programmable gate array Altera Complex programmable logic device Serial Peripheral Interface Bus Conventional PCI Boundary scan Electronic engineering Electronics Electronics manufacturing
136	What is happening with IEEE P1581? Heiko Ehrenberg ([removed]) GOEPEL Electronics LLC, Austin, Texas, USA Memory devices have been becoming more complex with every generation and this trend will continue. Add to Reading List Source URL: grouper.ieee.org Language: English - Date: 2005-12-12 13:59:44 Electronic engineering IEEE standards Boundary scan Joint Test Action Group IEEE Standards Association Field-programmable gate array Electronic design automation Serial Vector Format Boundary scan description language Electronics manufacturing Manufacturing Electronics
137	P1581 Status and Technical update Frans de Jong, Leon van de Logt Philips Research Prof.Holstlaan 4, 5656AA Eindhoven The Netherlands Add to Reading List Source URL: grouper.ieee.org Language: English - Date: 2002-08-29 03:51:00 Electronics Joint Test Action Group Boundary scan Scan chain Test engineer Universal Serial Bus Verilog In-circuit test Electronics manufacturing Electronic engineering Manufacturing
138	STATIC COMPONENT INTERCONNECTION TEST TECHNOLOGY IN PRACTICE Frans de Jong, Rob Raaijmakers Philips Research, Philips CFT, The Netherlands Email: [removed], [removed] Steffen Hellmold Add to Reading List Source URL: grouper.ieee.org Language: English - Date: 2001-07-23 12:55:02 Electronics manufacturing Electronic design automation Boundary scan Hardware description languages Joint Test Action Group Design for testing Scan chain Synchronous dynamic random-access memory XNOR gate Electronic engineering Manufacturing Electronics
139	Benefits of board and system level memory cluster test with IEEE P1581 Heiko Ehrenberg, GOEPEL Electronics Kenneth P. Parker, Agilent Technologies Bradford Van Treuren, Lucent Technologies Add to Reading List Source URL: grouper.ieee.org Language: English - Date: 2007-03-20 12:52:22 Electronics Technology Computer memory Boundary scan Standards organizations Joint Test Action Group Dynamic random-access memory Institute of Electrical and Electronics Engineers Memory controller Electronics manufacturing Manufacturing IEEE standards
140	What is happening with IEEE P1581? Heiko Ehrenberg P1581 working group chair GOEPEL Electronics What is happening with IEEE P1581? Add to Reading List Source URL: grouper.ieee.org Language: English - Date: 2005-12-12 13:59:44 Electronics Boundary scan Technology Joint Test Action Group ATML XSBI IEEE standards Electronics manufacturing Manufacturing

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